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Sntek Co., Ltd.

Supplier From South Korea (Republic Of Korea)
May-16-13

ITEM DESCRIPTION

Gun Size 2~16inch (Magnetron Sputter Gun)

Substrate Size ~ 200mm (option)

Process Gas Ar,O2,N2

Deposition Direction Up or Downward

Process Temp ~ 700 C

Thickness Uniformity <±3%

Heating Uniformity ±3%

Load Lock System
Full Automation Control


ITEM DESCRIPTION

Substrate Size 156mm² solar wafer, 12pcs(3.5G case, Option)

Sputtering Source based 1set (Option), Aprox 100 x 800m² 8T

Process Gas Ar,O2,N2

Deposition Direction Up or Downward

Al Film Thickness 2m

Uniformity WIW,WTW,RTR ±5%.


Jun-01-15

ITEM DESCRIPTION

Substrate Size ~ 6inch

Process Gas SiH4,GeH4,B2H6,PH3,Si2H6,H2,Ar

Process Temperature ~ 800 C

Halogen Lamp, Heating Load Lock, System Full Automation Control


Jun-01-15

ITEM DESCRIPTION

Substrate Size ~ 200mm (Option)

Etching Direction Downward

Process Gas Any of Requested Gas Based on Ar,O2,CF4,SF6

Etching Uniformity ±5%

Load Lock System, Full Automation Control


ITEM DESCRIPTION

Substrate Size ~ 8inch

Deposition Direction Upward

E-BEAM Source ~ 15kw

Thickness Uniformity ± 3%

Heating Uniformity ± 3%

Full Automation Control


ITEM DESCRIPTION

Substrate Size ~ 8inch

Deposition Direction Upward

Thermal Source ~ 10V, 300A

Thickness Uniformity ± 3%

Heating Uniformity ± 3%

Full Automation Control.


Jun-01-15

ITEM DESCRIPTION

Consisting of Evaporation,Sputter,Parylene,Glove Box,Loadlock

Tact time 20~80 min Depends on the number of mask

Loading Capacity Glass 1 Sheet, Mask 4 Sheet

Transfer Methode Vacuum Robot

Plasma Treatment Optional

Evaporation Source for Organic (5ea) 10cc for host, 4cc for dopant

Evaporation Source for metal (2ea) Thermal Source, E-Beam is optional

Deposition Uniformity Organic, Metal, Sputter less than ±3%

Max. deposition rate Organic 5A/sec, metal 10A/sec

Rate Accuracy Organic ±5%, Metal ±7%

Thickness reliability Organic & Metal ±5% glass to glass

Conductive Oxide Low Damage Sputtering (FTS or General Sputter)

Doping ratio less than 1% at 1A/sec of host.


ITEM DESCRIPTION

Substrate Size 2 inch

Heating Source Halogen Lamp

Deposition Direction Up or Downward

Process Temp ~ 1000 C

Heating Uniformity ±3%

Toggle Switch Control or Touch Panel Control.


ITEM DESCRIPTION

Substrate Size ~ 200mm (Option)

Deposition Direction Downward

Plasma Source RF & VHF Power Supply

Process Gas Any of Requested Gas based on Ar,O2

Process Temperature ~ 700 C

Uniformity ±3%

Heating Uniformity ±3%

Full Automation Control, Load Lock System.


ITEM DESCRIPTION

Substrate Size 156mm² solar wafer, 4pcs

Deposition Direction Downward

Plasma Source RF & VHF Power Supply

Process Gas Any of Requested Gas (Solar : Si3N4,SiO2,Al2O3)

Process Temperature ~ 700 C

Uniformity ±3%

Heating Uniformity ±3%

Full Automation Control, Load Lock System


ITEM DESCRIPTION

Substrate Size ~ 6inch

Deposition Direction Downward

Process Gas Any of Requested Gas

Process Temperature ~ 1000 C on Substrate

Uniformity ±3%

Heating Uniformity ±3%

Full Automation Control, Load Lock System


Jun-01-15

ITEM DESCRIPTION

Substrate Size ~ 6inch

Deposition Direction Downward

Process Gas Any of Requested Gas

Process Temperature ~ 700 C on Substrate

Source Heat Bubbler for Mo Source

Thickness Uniformity ±5%

Heating Uniformity ±3%

Load Lock System, Full Automation Control


Jun-01-15

ITEM DESCRIPTION

Substrate Size ~ 200mm (Option)

Etching Direction Downward

Process Gas Any of Requested Gas Based on Ar,O2,CF4,SF6

Etching Uniformity ±5%

Load Lock System, Full Automation Control


ITEM DESCRIPTION

Substrate Size ~ 12.5 inch

Etching Direction Downward

Process Gas Any of Requested Gas Based on Ar,O2,CF4,SF6

Etching Uniformity ±5%

Load Lock System, Full Automation Control


ITEM DESCRIPTION

Substrate Size ~ 8inch

Heating Source Halogen Lamp

Deposition Direction Up or Downward

Process Temp ~ 1000 C

Heating Uniformity ±3%

Toggle Switch Control or Touch Panel Control.


ITEM DESCRIPTION

Substrate Size 125mm² 16pcs, 156mm² 9pcs

Heating Source Halogen Lamp

Deposition Direction Up or Downward

Process Temp ~ 1100 C

Heating Uniformity ±5%

Sustain Time More Than 2min. at 1100

Lamping Rate 10 to 20 C / sec

Cooling Rate 5 to 20 C / sec

Gas mixing capability with MFC .


ITEM DESCRIPTION

Application The Cluster type equipment for the manuf acture of CIGS Solarcell.
Mo layer-CIGS la yer- IZnO-TCO layer etc. Sequentially form ation.


Substrate Type Glass & Wafer


Substrate Size ~ 200mm (option)

Metal Sputter Mo,ZnO,TCO


CIGS Evaporator Cu,In,Ga,Se Using effusion source

Glass Heating Max 300


ITEM DESCRIPTION

Application The Cluster type equipment for the manuf acture of a-Si Solar Cell. Back Contact la yer
Absorb layer-Front contact layer etc. S equentially formation.

Substrate Type Glass & Wafer

Substrate Size ~ 200mm (option)

Metal Sputter AZO,Ag & etc

PE-CVD PIN Layer

Glass Heating Max 300 C


 
 
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