Find Verified Wire Harness Probe Spring Pogo Pin Chz136 J Suppliers, Manufacturers and Wholesalers

Wire Harness Probe Spring-loaded Pogo Pin CHZ136-J Series Applied to Electronic Test

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ136-J harness probe we will introduce here is 1.36 mm in diameter and 32.8 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 6.9 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 130 gf, namely 4.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 130�?�±40 gf (4.5 oz) at load 4.6 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Harness Probe Pogo Pin CHZ136-H(8.4) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ136 harness probe we will introduce here is 1.36 mm in diameter and 33.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of nickel-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.3 mm at most when this probe works, although the plunger can move as far as 6.4 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.3 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating:   3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 113 ±33 gf (4 oz) @ load 4.3 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Ni Plated
Spring: SW-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.
�?� 
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Cable Harness Probe Pogo Pin CHZ136(250) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ136(250) harness probe we will introduce here is 1.36 mm in diameter and 33.1 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 6.7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 213 gf, namely 7.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 3.6 mm
Rated Stroke: 2.4 mm
Spring Force: 113 33 gf (4 oz) at load 2.4 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Wire Harness Probe Pogo Pin CHD136 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of the automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHD136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 255 gf, namely 9 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7 mm
Rated Stroke: 4.6 mm
Spring Force: 255�±75 gf (9 oz) at load 4.6 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Wire Harness Probe Pogo Pin CH203 Series for Electronic Test

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH203 harness probe we will introduce here is 2.03 mm in diameter and 35.9 mm in total length. Its barrel is made of phosphor bronze plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of stainless steel plated with gold and nickel.

This probe can withstand up to the current 5 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5 mm at most when this probe works, although the plunger can move as far as 7.75 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5 mm, its loaded force is about 145 gf, namely 5.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 5 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7.75 mm
Rated Stroke: 5 mm
Spring Force: 145 ±43 gf (5.5 oz) at load 5 mm

Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SUS, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Wire Harness Probe Pogo Pin CHL165 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL165 harness probe we will introduce here is 1.65 mm in diameter and 35.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 3.5 mm at most when this probe works, although the plunger can move as far as 5.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 3.5 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 5.3 mm
Rated Stroke: 3.5 mm
Spring Force: 113�?�±35 gf (4 oz) at load 3.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CH136-J for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5.3 mm at most when this probe works, although the plunger can move as far as 8 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.3 mm, its loaded force is about 57 gf, namely 2 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 8 mm
Rated Stroke: 5.3 mm
Spring Force: 57±17 gf (2 oz) at load 5.3 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Harness Probe Pogo Pin CH136 Series for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 2.67�?� mm at most when this probe works, although the plunger can move as far as 4�?� mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 2.67�?� mm, its loaded force is about 185�?� gf, namely 6.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications

Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.67 mm
Spring Force: 185 ±55 gf (6.5 oz) at   load 2.67 mm
Materials (plated)

Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.
�?� 
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Cable Harness Probe Pogo Pin CH136 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33  mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 1.67  mm at most when this probe works, although the plunger can move as far as 2.5  mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 1.67 mm, its loaded force is about 140  gf, namely 5  ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 2.5 mm
Rated Stroke: 1.67 mm
Spring Force: 140 ±40 gf (5 oz) at   load 1.67 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Cable Harness Probe Pogo Pin CHL265 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL265 harness probe we will introduce here is 2.65 mm in diameter and 28.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 3.5 mm at most when this probe works, although the plunger can move as far as 5.5 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 3.5 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 5.5 mm
Rated Stroke: 3.5 mm
Spring Force: 113�?�±35 gf (4 oz) at load 3.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CHZ199 Series for Electronic Test

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ199 harness probe we will introduce here is 1.99 mm in diameter and 33.2 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.4 mm at most when this probe works, although the plunger can move as far as 6.6 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.4 mm, its loaded force is about 133 gf, namely 4.7 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.6 mm
Rated Stroke: 4.4 mm
Spring Force: 133�?�±40 gf (4.7 oz) at load 4.4 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

For more information, please check below catalog.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.4 GHz at -1dB
Inductive Reactance: 1MHZ at -0.05996 uH
Capacitive Reactance: 1MHZ at 0.425647 uF

Specifications:
Full Stroke: 0.7 mm
Rated Stroke: 0.45 mm
Spring Force: 20 6 gf at load 0.45 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Spring Pogo Pin Semiconductor Test Probe SCPC028 Applied to IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPC028 we will introduce is 0.28 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 amps. The typical maximal contact resistance is about 150 milliohms.

The plunger can be pressed at a distance of up to 1.05 mm. But it is better to be pressed at a distance of 0.7 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.7 mm, the loaded force is about 25 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.

Materials (plated)
Barrel: Phosphor Bronze/Gold Clad Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 150 milliohms max
Bandwidth: 8.5 GHz at -1dB
Inductive Reactance: 1MHZ at -0.0788 uH
Capacitive Reactance: 1MHZ at 0.3165 uF

Specifications:
Full Stroke: 1.05 mm
Rated Stroke: 0.7 mm
Spring Force: 25�±7 gf at load 0.7 mm
Mechanical Life: about 100000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Spring Loaded Pogo Pin Test Probe BIP68 Series for Battery Contact

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP68 series of battery contact probes. The outside diameter is usually 0.68 mm and there are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 0.95 mm (37 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 0.5 mm
Rated Stroke: 0.4 mm
Spring Force: 10 gf (0.35 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.4 GHz at -1dB
Inductance: 1MHZ at -0.05996 uH
Captance: 1MHZ at 0.425647 uF

Specifications:
Full Stroke: 0.7 mm
Rated Stroke: 0.45 mm
Spring Force: 20�?�±6 gf at load 0.45 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Electronic Test Probe Double-sided Spring Pogo Pin SCPA057 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

SCPA057 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

Its parameters are as below.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 3 Amps
Contact Resistance: 100 milliohms, max
Bandwidth: 5 GHz at -1dB
Propagation Delay: 24 ps
Inductance: 1MHZ at -0.03664 uH
Captance: 1MHZ at -0.704638 uF

Specifications:
Full Stroke: 0.63 mm
Rated Stroke: 0.5 mm
Spring Force: 45 ±13 gf at load 0.5 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CH136-LJ7(6.1) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136-LJ7(6.1) harness probe we will introduce here is 1.36 mm in diameter and 33.1 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4 mm at most when this probe works, although the plunger can move as far as 6.1 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4 mm, its loaded force is about 225 gf, namely 8 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.1 mm
Rated Stroke: 4 mm
Spring Force: 225�±65 gf (8 oz) at load 4 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Cable Harness Probe Pogo Pin CHL165-HQ(8.3) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL165-HQ(8.3) harness probe we will introduce here is 1.65 mm in diameter and 35.8 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 3.5 mm at most when this probe works, although the plunger can move as far as 5.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 3.5 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 5.3 mm
Rated Stroke: 3.5 mm
Spring Force: 113�±35 gf (4 oz) at load 3.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CHL165-J6(8.5) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL165-J6(8.5) harness probe we will introduce here is 1.65 mm in diameter and 36 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 5.5 mm at most when this probe works, although the plunger can move as far as 8.5 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.5 mm, its loaded force is about 142 gf, namely 5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 8.5 mm
Rated Stroke: 5.5 mm
Spring Force: 142�±45 gf (5 oz) at load 5.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Cable Harness Probe Pogo Pin CH200-H(14) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH200 harness probe we will introduce here is 1.99 mm in diameter and 39 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.5 mm at most when this probe works, although the plunger can move as far as 7.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.5 mm, its loaded force is about 312 gf, namely 11 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7.3 mm
Rated Stroke: 4.5 mm
Spring Force: 312�?�±65 gf (11 oz) at load 4.5 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.